Gå till sökfältet
Gå till sidans huvudinnehåll
Gå till tillgänglighetsredogörelsen
Forskning.fi
Menu
Suomeksi
På svenska
In English
Ingångssida
Sökning
Vetenskaps- och innovationspolitik
Vetenskaps- och forskningsnyheter
På svenska
- 78260 results
Publikationer
78260
Utlysningar
0
Beviljade finansiering
0
Personer
2
Data
0
Infrastrukturer
0
Organisationer
0
Projekt
0
Publikationer -
78 260
sökresultat
Gå till sökresultaten
Visa som bild
Begränsa sökning
Resultaten visas 1 - 10 / 78260
10
50
100
resultat / per sida
Vilka
publikations
uppgifter finns i tjänsten?
Publikationens namn
Upphovspersoner
Publikationskanal
År
A novel method for millimeter-wave
on-wafer
characterization of reflect patch
antennas
Referentgranskad
DOI
10.1109/LAWP.2006.889554
Farinelli, Paola; Vähä-Heikkilä, Tauno; Säily, Jussi; Sorrentino, Roberto; Tuovinen, Jussi
IEEE
Antennas
and Wireless Propagation Letters
2006
On-wafer
noise parameter measurements at W-band
Referentgranskad
DOI
10.1109/TMTT.2003.812554
Vähä-Heikkilä, Tauno; Lahdes, Manu; Kantanen, Mikko; Tuovinen, Jussi
IEEE Transactions on Microwave Theory and Techniques
2003
Cryogenic
on-wafer
measurements at W-band and at 20-295 K
Referentgranskad
Vähä-Heikkilä, Tauno; Varis, Jussi; Hakojärvi, Hannu; Tuovinen, Jussi
ESA Conference Proceedings
2003
Wideband cryogenic
on-wafer
measurements at 20 - 295 K and 50-110 GHz
Referentgranskad
DOI
10.1109/EUMA.2003.341147
Vähä-Heikkilä, Tauno; Varis, Jussi; Hakojärvi, Hannu; Tuovinen, Jussi
33rd European Microwave Conference, EuMC 2003
2003
Very wideband automated
on-wafer
noise figure and gain measurements at 50-110 GHz
Referentgranskad
Vähä-Heikkilä, Tauno; Lahdes, Manu; Kantanen, Mikko; Karttaavi, Timo; Tuovinen, Jussi
European Microwave Association (EuMA)
2003
A wide-band
on-wafer
noise parameter measurement system at 50-75 GHz
Referentgranskad
DOI
10.1109/TMTT.2003.810129
Kantanen, Mikko; Lahdes, Manu; Vähä-Heikkilä, Tauno; Tuovinen, Jussi
IEEE Transactions on Microwave Theory and Techniques
2003
Development of
on-wafer
calibration methods and planar Schottky diode characterisation at THz frequencies
Öppen tillgång
Dahlberg, Krista
Aalto University
2014
On-body propagation performance with textile
antennas
at 867 MHz
Referentgranskad
DOI
10.1109/TAP.2012.2234713
Hirvonen, Mervi; Böhme, Christian; Severac, Daniel; Maman, Mickael
IEEE Transactions on
Antennas
and Propagation
2013
One-Antenna Radiation Pattern Measurement of
On-Wafer
Antennas
in Probe Station Environment
Referentgranskad
Öppen tillgång
Zheng, Jianfang; Ala-Laurinaho, Juha; Taylor, Zachary; Räisänen, Antti
Progress in Electromagnetics Research
2020
Compact 3-D
on-wafer
radiation pattern measurement system for 60 GHz
antennas
Referentgranskad
Ranvier, Sylvain; Kyrö, Mikko; Icheln, Clemens; Luxey, Cyril; Staraj, Robert; Vainikainen, Pertti
Microwave and Optical Technology Letters
2009
A novel method for millimeter-wave
on-wafer
characterization of reflect patch
antennas
Referentgranskad
DOI
10.1109/LAWP.2006.889554
2006
On-wafer
noise parameter measurements at W-band
Referentgranskad
DOI
10.1109/TMTT.2003.812554
2003
Cryogenic
on-wafer
measurements at W-band and at 20-295 K
Referentgranskad
2003
Wideband cryogenic
on-wafer
measurements at 20 - 295 K and 50-110 GHz
Referentgranskad
DOI
10.1109/EUMA.2003.341147
2003
Very wideband automated
on-wafer
noise figure and gain measurements at 50-110 GHz
Referentgranskad
2003
A wide-band
on-wafer
noise parameter measurement system at 50-75 GHz
Referentgranskad
DOI
10.1109/TMTT.2003.810129
2003
Development of
on-wafer
calibration methods and planar Schottky diode characterisation at THz frequencies
Öppen tillgång
2014
On-body propagation performance with textile
antennas
at 867 MHz
Referentgranskad
DOI
10.1109/TAP.2012.2234713
2013
One-Antenna Radiation Pattern Measurement of
On-Wafer
Antennas
in Probe Station Environment
Referentgranskad
Öppen tillgång
2020
Compact 3-D
on-wafer
radiation pattern measurement system for 60 GHz
antennas
Referentgranskad
2009
Föregående
1
2
3
4
5
Nästa
Resultaten visas 1 - 10 / 78260
Sida 1
Sort
